Yuille, A. L., Coughlan, J. ., Zhu, S. C., & Wu, Y. . (2000). Order Parameters for Minimax Entropy Distributions: When does high level knowledge help?. Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on, 1, 558–565. IEEE.
Yuille, A. L., Coughlan, J. ., Wu, Y. ., & Zhu, S. C. (2001). Order Parameters for Detecting Target Curves in Images: When does high level knowledge help?. International Journal of Computer Vision, 41, 9–33.
